Probe Card Design
We specialize in Probe Card Design for semiconductor wafer testing, providing one-stop services from design, simulation, and production to testing. Our solutions ensure precise and reliable performance to meet the highest industry standards.
Offer Different Type of Probe Card
Cantilever Probe Card
Our cantilever probe cards, using ReW (Rhenium Tungsten) or P7 alloy needles, provide excellent flexibility and are perfect for testing various chip types.
RF Probe Card
Our RF Probe Cards offer extensive options, with low to mid-frequency and high-frequency series covering DC to 8 GHz and DC to 20 GHz, respectively.
CIS Probe Cards
Tailored for high-speed CMOS image sensor testing in digital cameras and smartphones. With a wide temperature range, integrated ceramic head for stability.
LCD Probe Cards
Our LCD Probe Cards support high-speed testing up to 2.5Gbps, operate in a wide temperature range (-40°C to 140°C), and accommodate up to 4000 pins per card.
Logic Probe Cards
Our Logic Probe Cards are designed for efficient testing of a wide range of SOC, LOGIC, and MCU ICs, supporting high common test counts and up to 4000 pins per card.
Flash Probe Cards
Our Flash Probe Cards are optimized for efficient testing of FLASH memory chips used in USB drives and SSDs. With support for up to 5800 pins per card and high common test counts of up to 512 sites.
Vertical Probe Card
Our Vertical Probe Cards feature robust PCB + MLO + Head structures and utilize vertical probes for precise contact with delicate pads.
MEMS Probe Card
High precision using Micro-Electro-Mechanical Systems (MEMS), ideal for wafer testing of visual recognition chips, flash memory chips, and random access memory (RAM) chips.
Download Your FREE
Probe Card Catalog
Your Partner in Advanced Probe Technology
Wide Range of Industries
We offer narrow pitch flexible thin film probe solutions for a wide range of industries including optoelectronics, medical, automotive and telecommunications.
Quality Control
From meticulous engineering to rigorous testing protocols, our probe cards uphold the highest standards of reliability and performance.
Technical Capability
We deliver probe cards optimized for high-pin-count applications, maintaining exceptional performance and longevity across diverse semiconductor testing environments.
Advanced Equipment
Specializing in comprehensive development and manufacturing of probe card production line equipment, testing tools, and maintenance solutions, we offer high-precision, user-friendly equipment tailored to accommodate various probe card sizes.
Custom Probe
Our custom probe solutions cater to diverse testing needs, offering tailored designs that ensure precise compatibility and optimal performance across various semiconductor applications
Fast Production Cycle
Utilizing 3D modeling and numerical analysis design software, we evaluate every design to expedite client delivery cycles, offering unparalleled service capabilities that set us apart from competitors.
Our Main Service
PCB Carrier Board Design
Our PCB carrier board design offers a structured and versatile interface for connecting multiple probe cards with the device under test. Featuring support for various probe card PCB, CP PIB, and FT DIB designs, it enables high-speed data transmission and accommodates a variety of substrate materials to meet specific testing requirements with precision and efficiency
PIB/DIB PCB Design
Design of PCBs for Control Panel (PIB) and Film Transistor Array (DIB) portions of LCD testing.
Custom PCB Design
- Relay Boards: PCBs with a specified number of relays (e.g., 8, 16, etc.) for switching purposes.
- Fuse Boards: PCBs with a specific number of fuse connections (128 IO).
- High Power PCBs: PCBs designed to handle high voltage (3000V) and high current (400A).
ATE Test Board Catalog - Probe Card Universal PCBs
J750 Probe Card Universal PCB (V01)
- Channels: 512
- DPS (Data Path Select): 32
- UR (Upper Row): 64
- Size: φ12INCH*6.3mm
- Window size: 70mm
J750HD Probe Card Universal PCB
- Channels: 1024 (Slots 0-8)
- DPS: 96 (Slots 21-24)
- CTO: 16; BPMU: 16
- UR: 40
- Size: φ12INCH*6.3mm
- Window size: 70mm
J750HD Probe Card Universal PCB
- Channel: 1024 (SLOT 0-8)
- DPS: 96 (Slots 21-24)
- CTO: 32; BPMU: 16
- UR: 32
- SIZE: φ12INCH*6.3mm
- Window size : 120X60mm
Advantest 93K 11.5 Inch Universal PCB
- Channels: 1024
- DPS: 128
- UR: 64
- Size: φ11.5INCH*6.3mm
- Window size: 60mm
Advantest 93K 9.5Inch Universal PCB
- Channels: 512 (544)
- (Group1, 2, 3, 8/ 1, 2, 3, 4)
- DPS: 32
- UR: 32
- Size: φ9.5INCH*6.3mm
- Window size: 60mm
C3380P_(32X4) Universal PCB (V01)
- Channels: 576
- DPS: 128
- UR: 128
- Size: φ12INCH*6.3mm
- Window size: 120X60mm
C3380P_512 J type Universal PCB
- Channels: 512
- DPS: 64
- UR: 128
- Size: φ12INCH*6.3mm
- Window size: φ70mm
C3380D_256CH Universal PCB
- Channels: 256
- DPS: 32
- UR: 64
- Size: 114*310*3.0mm
- Window size: φ70mm or 50X50mm
C3360_G type Universal PCB
- Channels: 512 + 96
- DPS: 8+16
- UR: 32
- Size: φ214mm*4.75mm
- Window size: 60X35mm
YTEC S100_7D Universal PCB (V01)
- Channels: 768
- DPS: 48
- GPMU: 24 (potentially additional components)
- UR: 96
- Size: 238mm*308mm*5.0mm
- Window size: φ70mm
V50(YTEC S50) Universal PCB (V01)
- Channels: 256
- DPS: 8
- Size: 114mm*310mm*3.0mm
- Window size: φ50mm
T6373 ND3/4C Universal PCB (V01)
- Channels: 2403
- Size: φ12inch*6.3mm
- Window size: 88X40mm
Upgrade your testing today! Contact us for advanced probe card solutions and custom PCB designs. Let’s achieve precision together.